2017 Instrument Introduction Seminar

The Industrial Technology Support Center holds seminars that are useful for your corporate activities in cooperation with affiliated organizations and universities in Yokohama City, and is introduced on this page.
We look forward to your participation.

The Yokohama Industrial Technology Support Center has introduced and updated three processing and analytical equipment this year. In addition to introducing the outline and application of the instrument, we also provided time to actually see the instrument. Please come by all means.

Tuesday, February 27, 2018 13:00-16:45

Meeting room on the 5th floor of Yokohama Industrial Technology Support Center
(3-minute walk from Sangyo Shinko Center on the Kanazawa Seaside Line, 1-1-1 Fukuura, Kanazawa-ku, Yokohama)

Lecture 1 13:10-14:00 Concentration Ion Beam Processing Device (FIB)
“Introduction of JIB-4000 Concentration Ion Beam Processing Observation Device”
Mr. Tomohiro Sanpei, IB Business Unit, Nippon Electronics Corporation

Lecture 2 14:10-15:00 X-ray diffraction device (XRD)
"Basic course on X-ray diffraction measurement-Material evaluation using SmartLab-"
Takahiro Kuzumaki, X-Ray Equipment Division, Rigaku Corporation

Lecture 3 15:10-16:00 Thermal Analysis (TG-DTA / DSC)
"Basic course on TG-DTA, DSC-What do you know by thermal analysis? ～」
Mr. Yasuaki Masuda, Heat Analysis Equipment Division, Rigaku Corporation

Instrument tour 16:00-16:45

30 people

Free of charge

Please fill out the application form with required items and send it to the seminar secretariat by e-mail or fax.

Instrument Introduction Seminar (PDF: 410KB)

Monday, February 26, 2018