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Major test equipment

Last update date February 22, 2022

This is the main test equipment owned by the Industrial Technology Support Center. For inquiries regarding each test device and the requested test, please see the procedure page for using the Request Test.

X-ray diffraction equipment

Appearance of X-ray diffraction device

An X-ray diffraction device is an analyzer that can obtain information about crystals in a sample by irradiating X-rays to obtain information about crystals in a sample.

Detailed page of X-ray diffraction device


Thermal analyzer

Appearance of thermal analyzer

A thermal analyzer is a device that evaluates the physical properties of a sample with respect to temperature.
This device was introduced with the assistance of JKA's “2017 Bicycle Promotion Project for Bicycles”.

Detailed page of thermal analyzer


Ion milling equipment

Appearance of ion milling equipment

The ion milling device is a cross-sectional fabrication device used as pretreatment when performing cross-sectional observation of a sample using an electron microscope.
This device was introduced with the assistance of JKA's “2016 Bicycle Machine Industry Promotion Aid Project (RING! RING! Project)”.

Detailed page of Ion Milling Description Page


Automatic polishing equipment

Appearance of automated polishing equipment

The automatic polishing device is a pretreatment device that grins the observation surface when performing cross-sectional observation of surface treatment products.
This device was introduced with the assistance of JKA's “2016 Bicycle Machine Industry Promotion Aid Project (RING! RING! Project)”.

Detailed description page of automatic polishing equipment


Tactile surface geometry measuring machine

Appearance of palpable surface geometry measuring machine

The tactile surface geometry measuring instrument is a device that places the tip of the tactile needle is placed on the measured surface, moves the stitches along the surface, and electrically enlarges the amount of up and down due to uneven surface unevenness of the surface. It is possible to perform two-dimensional surface roughness analysis and step measurement.
This device was introduced with the assistance of JKA's “2013 Small Vehicles and Other Machine Industry Promotion Aid Project (RING! RING! Project)”.

Detailed description page of the pallet type surface shape measuring machine


Hardness tester

hardness

A hardness tester is a device that gradually increases the load of a positive square cone diamond inhibitor to the surface of the sample, measures the push depth, and examine the hardness and physical properties.

Detailed description page of hardness tester


Friction tester (ball-on-disk)

friction

A friction tester is a device that calculates the coefficient from the frictional force between the ball and the specimen is placed on the surface of the sample, applying a load, and the disc on which the specimen is placed.

Detailed page of friction tester (ball-on disk)


Friction wear tester

Wear tester


The friction wear tester can perform ball (pin)-on-disk friction tests to evaluate wear resistance and burn resistance, and scratch tests to evaluate the strength and adhesion of thin films.
This device was introduced with the assistance of JKA's "2012 Small Vehicles and Other Machine Industry Promotion Aid Project (RING! RING! Project)".

Detailed page of friction wear tester


Electronic wire microanalyzer (EPMA)

EPMA

An electron microanalyzer is a device that examines the elements that make up a substance by irradiating a thin, narrowed electron beam to a sample and detects characteristic X-rays generated from the surface.
Detailed page of Electronic Wire Micro Analyzer (EPMA)


Electrical field radiated scanning electron microscope (FE-SEM)

Electrical field radiated scanning electron microscope (FE-SEM)

An electron microscope is a device that observes the uneven surface by irradiating an electron beam to a sample and detects the secondary electrons reflected on the surface.

Detailed page of electric field radiated scanning electron microscope (FE-SEM)


ellipsometer (ellipsometer)

Ellipsomator

The ellipsometer is a device that measures the changes in the incident light and the polarization of reflected light on the surface of a substance, and examines the film thickness and refractive index of the thin film.

Detailed page of Elipsomator


Microscope

microscope

The microscope is a device with a lens attached to a CCD camera and observes samples at various magnifications. In addition, it is also possible to create a simple three-dimensional image.

Microscope detail page


Fluorescent X-ray film thickness meter

Appearance of fluorescent X-ray film thickness meter

A fluorescent X-ray film thickness meter is a device that irradiates a thin film sample that has been plated with X-rays, detects X-rays generated there, and examines the film thickness of the thin film.

Detailed description page of fluorescent X-ray film thickness meter


Salt water spray tester

Exterior appearance of salt spray tester

A salt spray tester is a device that keeps the inside of the instrument heated and high humidity, sprays the sample with sodium chloride solution to examine the corrosion resistance of the material.
This device was introduced with the assistance of JKA's “2014 Bicycle Machine Industry Promotion Aid Project (RING! RING! Project)”.

Detailed page of salt water spray tester


Temperature Hydrogen Tester

Constant temperature tester


The constant temperature and humidity tester is a device that can control temperature and humidity constantly, and examines the characteristics of materials that change depending on temperature and humidity conditions.

Detailed page of the Temperature Temperature Hydrogen Tester


Fourier transform infrared spectroscopic analyzer (FT-IR)

FT-IR appearance

The Fourier transform infrared spectroscopic analyzer is a device that mainly performs structural analysis of organic matter by irradiating a sample with infrared light to measure the transmitted or reflected light.


Detailed page of Fourier Transform Infrared Spectrospectrometer (FT-IR)

For inquiries to this page

Small and Medium Enterprise Promotion Division, Small and Medium Enterprises, Economic Affairs Bureau

Phone: 045-671-4236

Phone: 045-671-4236

Fax: 045-664-4867

Email address: ke-keiei@city.yokohama.jp

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Page ID: 565-114-987

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